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ESD protection, TVS, filtering and signal conditioning

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Analog & Logic ICs

Automotive qualified products (AEC-Q100/Q101)
74HCT4017BQ-Q100

74HCT4017BQ-Q100 Production

Johnson decade counter with 10 decoded outputs

The 74HC4017-Q100; 74HCT4017-Q100 is a 5-stage Johnson decade counter with 10 decoded outputs (Q0 to Q9), an output from the most significant flip-flop (Q5-9), two clock inputs (CP0 and CP1) and an overriding asynchronous master reset input (MR). The counter is advanced by either a LOW-to-HIGH transition at CP0 while CP1 is LOW or a HIGH-to-LOW transition at CP1 while CP0 is HIGH. When cascading counters, the Q5-9 output, which is LOW while the counter is in states 5, 6, 7, 8 and 9, can be used to drive the CP0 input of the next counter. A HIGH on MR resets the counter to zero (Q0 = Q5-9 = HIGH; Q1 to Q9 = LOW) independent of the clock inputs (CP0 and CP1). Automatic code correction of the counter is provided by an internal circuit: following any illegal code the counter returns to a proper counting mode within 11 clock pulses. Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.

This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
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Product details

Features and benefits

  • Automotive product qualification in accordance with AEC-Q100 (Grade 1)

    • Specified from -40 °C to +85 °C and from -40 °C to +125 °C

  • Wide supply voltage range from 2.0 V to 6.0 V

  • CMOS low power dissipation

  • High noise immunity

  • Latch-up performance exceeds 100 mA per JESD 78 Class II Level B

  • Complies with JEDEC standards:

    • JESD8C (2.7 V to 3.6 V)
    • JESD7A (2.0 V to 6.0 V)

  • Input levels:

    • For 74HC4017-Q100: CMOS level

    • For 74HCT4017-Q100: TTL level

  • ESD protection:

    • HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V

    • CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V

  • Multiple package options

  • DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of solder joints

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More information

Quality and reliability disclaimer

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Longevity

The Nexperia Longevity Program is aimed to provide our customers information from time to time about the expected time that our products can be ordered. The NLP is reviewed and updated regularly by our Executive Management Team. View our longevity program here.

Sample

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Interactive datasheet

How does it work?

The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.

Interactive datasheet